A general view of Wei-Hai-Wei, after its capture

A general view of Wei-Hai-Wei, after its capture

RP-F-2001-7-1637B-47

inscription: ‘Expedition to Wei-Hai-Wei.’

• photographer: Ordnance Survey, Shandong
• clichémaker: Kazumasa Ogawa, Japan

1895-02-24

lichtdruk

height 204 mm x width 283 mm

Purchased with the support of the Mondriaan Stichting, the Prins Bernhard Cultuurfonds, the VSBfonds, the Paul Huf Fonds/Rijksmuseum Fonds and the Egbert Kunstfonds

purchase 2001

Public domain

M. Fitski en M. Boom, 'Japan: bloesem, verlangen en krijgsgeweld', Rijksmuseum Kunstkrant 33 (2007), nr. 3, p. 17, afb.

To refer to this object, please use the following persistent URL:

https://id.rijksmuseum.nl/200632724